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Proceedings /

Authors: Institute of Electrical and Electronics Engineers Published by : The Conference ; | Can be ordered from IEEE Service Center, (Altoona, PA : | Piscataway, N.J. :) Physical details: xii, 1033 p. : ill. ; 28 cm ISBN: 0780321030 (casebound); 0780321022 (softbound). Subject(s): Integrated circuits --Testing --Congresses | Electronic digital computers --Circuits --Testing --Congresses Year: 1994 List(s) this item appears in: B-ON / IEEE Conference
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Item type Location Call number Status Date due
Livro Livro IST - Biblioteca do Tagus Park
IST-Bib Tagus Park
TK7874.I.73265 (Browse shelf) Available

Cover title: TEST, the next 25 years

Spine title: IEEE International Test Conference 1994

"IEEE catalog number 94CH34835"--T.p. verso

Includes bibliographical references and index

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