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Meeting the tests of time :

Authors: IEEE Computer Society.--Test Technology Technical Committee | IEEE Computer Society.--Philadelphia Chapter Published by : IEEE Computer Society Press, (Washington :) Physical details: xxxiv, 959 p. : ill. ; 29 cm. ISBN: 0818689625. Subject(s): Integrated circuits --Testing --Congresses | Automatic checkout equipment --Congresses Year: 1989 List(s) this item appears in: B-ON / IEEE Conference
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Livro Livro IST - Biblioteca do Tagus Park
IST-Bib Tagus Park
TK7874.I.73260 (Browse shelf) Available

"IEEE catalog number 89CH2742-5"--T.p. verso

Includes bibliographical references and index

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