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New frontiers in testing :

Authors: IEEE Computer Society.--Test Technology Technical Committee | Institute of Electrical and Electronics Engineers.--Philadelphia Section Published by : Computer Society Press of the IEEE, (Washington, D.C. :) Physical details: xxx, 1005 p. : ill. ; 28 cm. ISBN: 0818608706 (pbk.). Subject(s): Integrated circuits --Testing --Congresses | Electronic digital computers --Circuits --Testing --Congresses | Automatic test equipment --Congresses Year: 1988 List(s) this item appears in: B-ON / IEEE Conference
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Item type Location Call number Status Date due
Livro Livro IST - Biblioteca do Tagus Park
IST-Bib Tagus Park
TK7874.I.73259 (Browse shelf) Available

"Computer Society order number 870"

"IEEE catalog number 88CM2610-4"

Includes bibliographies and index

Online version also available to IEEE Xplore subscribers

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