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Proceedings [of the] 10th IEEE International On-Line Testing Symposium :
Publication:
Los Alamitos, Calif. : IEEE Computer Society, 2004
, Acesso online através do IEEE Xplore (b-on). Restritivo ao campus do IST.
Date:2004
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IST - Biblioteca do Tagus Park
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2. |
The Test access port and boundary-scan architecture
Publication:
Los Alamitos, Calif. IEEE Computer Society Press 1991
. xxii, 372 p.
29 cm
Date:1991
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3. |
Testability of electronic circuits
by Weyerer, Manfred
Publication:
Munich | Englewood Cliffs, NJ C. Hanser | Prentice Hall 1992
. xv, 232 p.
, Translation of: Prüfbarkeit elektronischer Schaltungen
24 cm
Date:1992
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